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 2SK2611
Silicon N-Channel MOSFET
Features
11A,500V,RDS(on)(Max0.55)@VGS=10V Ultra-low Gate charge(Typical 43nC) Fast Switching Capability 100%Avalanche Tested Maximum Junction Temperature Range(150)
General Description
This Power MOSFET is produced using Winsemi's advancedplanar stripe,VDMOS technology. this latest technology has beenespecially designed to minimize on-state resistance, have a high rugged avalanche characteristics .This devices is specially wellsuited for AC-DC switching power supplies, DC-DC power Converters high voltage H-bridge motor drive PWM
Absolute Maximum Ratings
Symbol
VDSS ID Continuous Drain Current(@Tc=100) IDM VGS EAS EAR dv/dt PD TJ,Tstg TL Drain Current Pulsed Gate to Source Voltage Single Pulsed Avalanche Energy Repetitive Avalanche Energy Peak Diode Recovery dv /dt Total Power Dissipation(@Tc=25) Junction and Storage Temperature Channel Temperature (Note2) (Note1) (Note3) (Note1) 7 44 30 670 19.5 4.5 195 -55~150 300 A A V mJ mJ V/ ns W Drain Source Voltage Continuous Drain Current(@Tc=25)
Parameter
Value
500 11
Units
V A
Thermal Characteristics
Symbol
RQJC RQJA
Parameter
Thermal Resistance , Junction -to -Case Thermal Resistance , Junction-to -Ambient
Value Min
-
Typ
-
Max
0.64 62.5
Units
/W /W
Rev.A Aug.2010
Copyright@WinSemi Semiconductor Co., Ltd., All right reserved.
2SK2611
Electrical Characteristics(Tc=25)
Characteristics
Gate leakage current Gate-source breakdown voltage
Symbol
IGSS V(BR)GSS
Test Condition
VGS=30V,VDS=0V IG=10 A,VDS=0V VDS=500V,VGS=0V
Min
30 500 2 -
Type
0.48 15 1515 25 185 70 24 75 120 43 8 19
Max
100 10
Unit
nA V
Drain cut -off current
IDSS VDS=400V,Tc=125 100 4 0.55 2055 30 235 150 57
A
Drain -source breakdown voltage Gate threshold voltage Drain -source ON resistance Forward Transconductance Input capacitance Reverse transfer capacitance Output capacitance Rise time Turn-on time Switching time Fall time Turn-off time Total gate charge(gate-source
V(BR)DSS VGS(th) RDS(ON) gfs Ciss Crss Coss tr ton tf toff
ID=10 mA,VGS=0V VDS=VGS,ID=250A VGS=10V,ID=5.5A VDS=40V,ID=5.5A VDS=25V, VGS=0V, f=1MHz VDD=250V, ID=11A RG=25 (Note4,5) VDS=400V,
V V S
pF
ns 160 250 55 nC -
-
Qg plus gate-drain) Gate-source charge Gate-drain("miller") Charge Qgs Qgd VGS=10V, ID=11A (Note4,5)
-
Source-Drain Ratings and Characteristics(Ta=25)
Characteristics
Continuous drain reverse current Pulse drain reverse current Forward voltage(diode) Reverse recovery time Reverse recovery charge
Symbol
IDR IDRP VDSF trr Qrr
Test Condition
IDR=11A,VGS=0V IDR=11A,VGS=0V, dIDR / dt =100 A / s
Min
-
Type
90 1.5
Max
11 44 1.4 -
Unit
A A V ns C
Note 1.Repeativity rating :pulse width limited by junction temperature 2.L=10mH IAS=11A,VDD=50V,R G=25,Starting TJ=25 3.ISD11A,di/dt200A/us,VDD2/7
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2SK2611
Fig.1 On State Characteristics
Fig.2 Transfer Current Characteristics
Fig.3 On-Resistance Variation vs Drain Current
Fig.4 Body Diode Forward Voltage Variation with Source Current and Temperature
Fig.5 Capacitance Characteristics
Fig.6 Gate Charge Characteristics
3/7
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2SK2611
Fig.7 Breakdown Voltage Variation
Fig.8 On-Resistance Variation vs.Temperature
Fig.9 Maximum Safe Operation Area
Fig.10 Maximum Drain Current vs Case Temperature
Fig.11Transient Thermal Response Curve
4/7
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2SK2611
Fig.12Gate Test Circuit & Waveform
Fig.13 Resistive Switching Test Circuit & Waveform
Fig.14Unclamped Inductive Switching Test Circuit & Waveform 5/7
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2SK2611
Fig.15 Peak Diode Recovery dv/dt Test Circuit & Waveform
6/7
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2SK2611
TO-3P Package Dimension TO-3P
Unit:mm
7/7
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